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This commit adds unit tests for ADC uclass's methods using sandbox ADC.
Testing proper ADC binding:
- dm_test_adc_bind() - device binding
- dm_test_adc_wrong_channel_selection() - checking wrong channel selection
Testing ADC supply operations:
- dm_test_adc_supply():
- Vdd/Vss values validating
- Vdd regulator updated value validating
- Vdd regulator's auto enable state validating
Testing ADC operations results:
- dm_test_adc_single_channel_conversion() - single channel start/data
- dm_test_adc_single_channel_shot() - single channel shot
- dm_test_adc_multi_channel_conversion() - multi channel start/data
- dm_test_adc_multi_channel_shot() - multi channel single shot
Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com>
Cc: Simon Glass <sjg@chromium.org>
Signed-off-by: Minkyu Kang <mk7.kang@samsung.com>
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