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author | Shmulik Ladkani <shmulik@jungo.com> | 2012-06-08 15:29:06 (GMT) |
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committer | David Woodhouse <David.Woodhouse@intel.com> | 2012-06-09 11:02:04 (GMT) |
commit | ea3b2ea24ef0f2ef9c6795b19cff456195b6728a (patch) | |
tree | 8a1c645a82a7329631166cf6e3f63857d401da40 /kernel/trace/trace_printk.c | |
parent | cfaf025112d3856637ff34a767ef785ef5cf2ca9 (diff) | |
download | linux-fsl-qoriq-ea3b2ea24ef0f2ef9c6795b19cff456195b6728a.tar.xz |
mtd: nand: initialize bitflip_threshold prior to BBT scanning
As of edbc454 [mtd: driver _read() returns max_bitflips; mtd_read()
returns -EUCLEAN], 'mtd->bitflip_threshold' must be set for mtd devices
having ECC, prior any 'mtd_read()' call.
Otherwise, 'mtd_read()' will falsely return -EUCLEAN.
Normally, 'mtd->bitflip_threshold' is initialized when the MTD is added.
However, this is too late for NAND MTDs, as 'scan_bbt()' is invoked
prior the existing initialization of 'mtd->bitflip_threshold'.
This is a problem since 'scan_bbt()' calls 'mtd_read()', in the case
of a flash-based bad block table.
It resulted in a falsely reported bitflips indication during BBT read,
which lead to constant scrubbing of the flash BBT blocks.
Initialize 'mtd->bitflip_threshold' to its default value (if not already
set by the driver), prior to invocation of 'scan_bbt()'.
Reported-by: Sascha Hauer <s.hauer@pengutronix.de>
Tested-by: Sascha Hauer <s.hauer@pengutronix.de>
Signed-off-by: Shmulik Ladkani <shmulik.ladkani@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Diffstat (limited to 'kernel/trace/trace_printk.c')
0 files changed, 0 insertions, 0 deletions