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authorKrzysztof Kozlowski <k.kozlowski@samsung.com>2015-06-08 01:35:49 (GMT)
committerEduardo Valentin <edubezval@gmail.com>2015-08-03 02:36:57 (GMT)
commit5f09a5cbd14ae16e93866040fa44d930ff885650 (patch)
tree69df2475150bcfef84b350f70dd889358d5e1f09 /drivers/md/dm.h
parentd5f831090191fa26a539e12456af64547ab11dde (diff)
downloadlinux-5f09a5cbd14ae16e93866040fa44d930ff885650.tar.xz
thermal: exynos: Disable the regulator on probe failure
During probe the regulator (if present) was enabled but not disabled in case of failure. So an unsuccessful probe lead to enabling the regulator which was actually not needed because the device was not enabled. Additionally each deferred probe lead to increase of regulator enable count so it would not be effectively disabled during removal of the device. Test HW: Exynos4412 - Trats2 board Signed-off-by: Krzysztof Kozlowski <k.kozlowski@samsung.com> Fixes: 498d22f616f6 ("thermal: exynos: Support for TMU regulator defined at device tree") Cc: <stable@vger.kernel.org> Reviewed-by: Javier Martinez Canillas <javier.martinez@collabora.co.uk> Signed-off-by: Lukasz Majewski <l.majewski@samsung.com> Tested-by: Lukasz Majewski <l.majewski@samsung.com> Signed-off-by: Eduardo Valentin <edubezval@gmail.com>
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