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2013-03-03Merge tag 'for-linus-20130301' of git://git.infradead.org/linux-mtdLinus Torvalds
Pull MTD update from David Woodhouse: "Fairly unexciting MTD merge for 3.9: - misc clean-ups in the MTD command-line partitioning parser (cmdlinepart) - add flash locking support for STmicro chips serial flash chips, as well as for CFI command set 2 chips. - new driver for the ELM error correction HW module found in various TI chips, enable the OMAP NAND driver to use the ELM HW error correction - added number of new serial flash IDs - various fixes and improvements in the gpmi NAND driver - bcm47xx NAND driver improvements - make the mtdpart module actually removable" * tag 'for-linus-20130301' of git://git.infradead.org/linux-mtd: (45 commits) mtd: map: BUG() in non handled cases mtd: bcm47xxnflash: use pr_fmt for module prefix in messages mtd: davinci_nand: Use managed resources mtd: mtd_torturetest can cause stack overflows mtd: physmap_of: Convert device allocation to managed devm_kzalloc() mtd: at91: atmel_nand: for PMECC, add code to check the ONFI parameter ECC requirement. mtd: atmel_nand: make pmecc-cap, pmecc-sector-size in dts is optional. mtd: atmel_nand: avoid to report an error when lookup table offset is 0. mtd: bcm47xxsflash: adjust names of bus-specific functions mtd: bcm47xxpart: improve probing of nvram partition mtd: bcm47xxpart: add support for other erase sizes mtd: bcm47xxnflash: register this as normal driver mtd: bcm47xxnflash: fix message mtd: bcm47xxsflash: register this as normal driver mtd: bcm47xxsflash: write number of written bytes mtd: gpmi: add sanity check for the ECC mtd: gpmi: set the Golois Field bit for mx6q's BCH mtd: devices: elm: Removes <xx> literals in elm DT node mtd: gpmi: fix a dereferencing freed memory error mtd: fix the wrong timeo for panic_nand_wait() ...
2013-02-28mtd: mtd_stresstest: use prandom_bytes()Akinobu Mita
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Artem Bityutskiy <dedekind1@gmail.com> Cc: David Woodhouse <dwmw2@infradead.org> Cc: "Theodore Ts'o" <tytso@mit.edu> Cc: Adrian Hunter <adrian.hunter@intel.com> Cc: David Laight <david.laight@aculab.com> Cc: Eilon Greenstein <eilong@broadcom.com> Cc: Michel Lespinasse <walken@google.com> Cc: Robert Love <robert.w.love@intel.com> Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
2013-02-28mtd: mtd_subpagetest: convert to use prandom libraryAkinobu Mita
This removes home-brewed pseudo-random number generator and use prandom library. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Artem Bityutskiy <dedekind1@gmail.com> Cc: David Woodhouse <dwmw2@infradead.org> Cc: "Theodore Ts'o" <tytso@mit.edu> Cc: Adrian Hunter <adrian.hunter@intel.com> Cc: David Laight <david.laight@aculab.com> Cc: Eilon Greenstein <eilong@broadcom.com> Cc: Michel Lespinasse <walken@google.com> Cc: Robert Love <robert.w.love@intel.com> Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
2013-02-28mtd: mtd_speedtest: use prandom_bytesAkinobu Mita
Use prandom_bytes instead of equivalent local function. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Artem Bityutskiy <dedekind1@gmail.com> Cc: David Woodhouse <dwmw2@infradead.org> Cc: "Theodore Ts'o" <tytso@mit.edu> Cc: Adrian Hunter <adrian.hunter@intel.com> Cc: David Laight <david.laight@aculab.com> Cc: Eilon Greenstein <eilong@broadcom.com> Cc: Michel Lespinasse <walken@google.com> Cc: Robert Love <robert.w.love@intel.com> Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
2013-02-28mtd: mtd_pagetest: convert to use prandom libraryAkinobu Mita
This removes home-brewed pseudo-random number generator and use prandom library. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Artem Bityutskiy <dedekind1@gmail.com> Cc: David Woodhouse <dwmw2@infradead.org> Cc: "Theodore Ts'o" <tytso@mit.edu> Cc: Adrian Hunter <adrian.hunter@intel.com> Cc: David Laight <david.laight@aculab.com> Cc: Eilon Greenstein <eilong@broadcom.com> Cc: Michel Lespinasse <walken@google.com> Cc: Robert Love <robert.w.love@intel.com> Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
2013-02-28mtd: mtd_oobtest: convert to use prandom libraryAkinobu Mita
This removes home-brewed pseudo-random number generator and use prandom library. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Artem Bityutskiy <dedekind1@gmail.com> Cc: David Woodhouse <dwmw2@infradead.org> Cc: "Theodore Ts'o" <tytso@mit.edu> Cc: Adrian Hunter <adrian.hunter@intel.com> Cc: David Laight <david.laight@aculab.com> Cc: Eilon Greenstein <eilong@broadcom.com> Cc: Michel Lespinasse <walken@google.com> Cc: Robert Love <robert.w.love@intel.com> Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
2013-02-28mtd: mtd_nandecctest: use prandom_bytes instead of get_random_bytes()Akinobu Mita
Using prandom_bytes() is enough. Because this data is only used for testing, not used for cryptographic use. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Artem Bityutskiy <dedekind1@gmail.com> Cc: David Woodhouse <dwmw2@infradead.org> Cc: "Theodore Ts'o" <tytso@mit.edu> Cc: Adrian Hunter <adrian.hunter@intel.com> Cc: David Laight <david.laight@aculab.com> Cc: Eilon Greenstein <eilong@broadcom.com> Cc: Michel Lespinasse <walken@google.com> Cc: Robert Love <robert.w.love@intel.com> Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
2013-02-13mtd: mtd_torturetest can cause stack overflowsAl Cooper
mtd_torturetest uses the module parm "ebcnt" to control the size of a stack based array of int's. When "ebcnt" is large, Ex: 1000, it causes stack overflows on systems with small kernel stacks. The fix is to move the array from the stack to kmalloc memory. Signed-off-by: Al Cooper <alcooperx@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2013-02-04mtd: rename random32() to prandom_u32()Akinobu Mita
Use more preferable function name which implies using a pseudo-random number generator. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-12-04mtd: tests/read: initialize buffer for whole next pageChristian Herzig
fix: do block-buffer initialize for the whole next page to zero. Signed-off-by: Christian Herzig <christian.herzig@keymile.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-18mtd: Fix typo mtd/testsMasanari Iida
Correct spelling typo in printk within drivers/mtd/tests. Signed-off-by: Masanari Iida <standby24x7@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: mtd_oobtest: printk -> pr_{info,err,crit}Vikram Narayanan
Use pr_info() and pr_err() while defining pr_fmt(). This saves a few characters, joins a few lines, and makes the code a little more readable (and grep-able). Signed-off-by: Brian Norris <computersforpeace@gmail.com> Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_torturetest: Replace printk with pr_{info,crit}Vikram Narayanan
Use pr_fmt instead of PRINT_PREF macro Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_subpagetest: replace printk with pr_{info,crit,err}Vikram Narayanan
Use pr_fmt instead of PRINT_PREF macro Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_speedtest: Replace printk with pr_{info,crit,err}Vikram Narayanan
Use pr_fmt instead of PRINT_PREF macro Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_stresstest: Replace printk with pr_{info,crit,err}Vikram Narayanan
Use pr_fmt instead of PRINT_PREF macro Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_readtest: Replace printk with pr_{info,err}Vikram Narayanan
Use pr_fmt instead of PRINT_PREF macro Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_pagetest: Replace printk with pr_{info,crit,err}Vikram Narayanan
Use pr_fmt instead of PRINT_PREF macro Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_nandecctest: Use pr_fmt macroVikram Narayanan
Use KBUILD_MODNAME instead of hardcoding the filename Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_nandbiterrs: replace msg macro with pr_{info,err}Vikram Narayanan
Use pr_fmt instead of msg macro Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-09-29mtd: mtd_nandecctest: add double bit error detection testsAkinobu Mita
This adds the double bit error detection test cases listed below: * Prepare data block with double bit error and ECC data without corruption, and verify that the uncorrectable error is detected by __nand_correct_data(). * Prepare data block with single bit error and ECC data with single bit error, and verify that the uncorrectable error is detected. * Prepare data block without corruption and ECC data with double bit error, and verify that the uncorrectable error is detected. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: add single bit error correction testAkinobu Mita
This adds the single bit error correction test case listed below: Prepare data block without corruption and ECC data with single bit error, and verify that the data block is preserved by __nand_correct_data(). Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: add no corruption testAkinobu Mita
This adds no corruptin test case listed below: Prepare data block and ECC data with no corruption, and verify that the data block is preserved by __nand_correct_data() Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: rewrite the test routineAkinobu Mita
This rewrites the entire test routine in order to make it easy to add more tests by later changes and minimize duplication of each tests as much as possible. Now that each test is described by the members of struct nand_ecc_test: - name: descriptive testname - prepare: function to prepare data block and ecc with artifical corruption - verify: function to verify the result of correcting data block Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: support injecting bit error for ecc codeAkinobu Mita
Currently inject_single_bit_error() is used to inject single bit error into randomly selected bit position of the 256 or 512 bytes data block. Later change will add tests which inject bit errors into the ecc code. Unfortunately, inject_single_bit_error() doesn't work for the ecc code which is not a multiple of sizeof(unsigned long). Because bit fliping at random position is done by __change_bit(). For example, flipping bit position 0 by __change_bit(0, addr) modifies 3rd byte (32bit) or 7th byte (64bit) on big-endian systems. Using little-endian version of bitops can fix this issue. But little-endian version of __change_bit is not yet available. So this defines __change_bit_le() locally in a similar fashion to asm-generic/bitops/le.h and use it. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: tests: test for multi-bit error correctionIwo Mergler
This tests ECC biterror recovery on a single NAND page. Mostly intended to test ECC hardware and low-level NAND driver. There are two test modes: 0 - artificially inserting bit errors until the ECC fails This is the default method and fairly quick. It should be independent of the quality of the FLASH. 1 - re-writing the same pattern repeatedly until the ECC fails. This method relies on the physics of NAND FLASH to eventually generate '0' bits if '1' has been written sufficient times. Depending on the NAND, the first bit errors will appear after 1000 or more writes and then will usually snowball, reaching the limits of the ECC quickly. The test stops after 10000 cycles, should your FLASH be exceptionally good and not generate bit errors before that. Try a different page offset in that case. Please note that neither of these tests will significantly 'use up' any FLASH endurance. Only a maximum of two erase operations will be performed. Signed-off-by: Iwo Mergler <Iwo.Mergler@netcommwireless.com.au> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: ensure alignment requirement for bitopsAkinobu Mita
Currently the data blocks which is used to test single bit error correction is allocated statically and injecting single bit error is implemented by using __change_bit() which must operate on the memory aligned to the size of an "unsigned long". But there is no such guarantee for statically allocated array. This fix the issue by allocating the data block dynamically by kmalloc(). It also allocate the ecc code dynamically instead of allocating statically on stack. The reason to allocate the ecc code dynamically is that later change will add tests which inject bit errors into the ecc code by bitops. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: improve message outputAkinobu Mita
This includes the message related changes: - Use pr_* instead of printk - Print hexdump of ECC code if test fails - Change log level for hexdump of data from KERN_DEBUG to KERN_INFO - Factor out the hexdump code into a separate function Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: make module_init() return appropriate errnoAkinobu Mita
Return -EINVAL instead of -1 (-EPERM) when test fails. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: remove unnecessary includeAkinobu Mita
Including linux/jiffies.h was required for calling srandom32(jiffies) that has already been removed. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: make module_init() return an error code if test failsAkinobu Mita
Return an error code if test fails in order to detect a test case failure by invoking tests repeatedly like this: while sudo modprobe mtd_nandecctest; do sudo modprobe -r mtd_nandecctest done Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: remove unnecessary srandom32() callAkinobu Mita
It is unnecessary for this driver to call srandom32() in module_init. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-07-06mtd: tests: use random32 instead of home-brewed generatorArtem Bityutskiy
This is a clean-up patch which removes the own pseudo-random numbers generator from the speed- and stress-tests and makes them use the 'random32()' generator instead. [dwmw2: Merge later fix for negative offsets] Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09mtd: introduce mtd_can_have_bb helperArtem Bityutskiy
This patch introduces new 'mtd_can_have_bb()' helper function which checks whether the flash can have bad eraseblocks. Then it changes all the direct 'mtd->block_isbad' use cases with 'mtd_can_have_bb()'. Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09mtd: remove extra retlen assignmentArtem Bityutskiy
MTD functions always assign the 'retlen' argument to 0 at the very beginning - the callers do not have to do this. I used the following semantic patch to find these places: @@ identifier retlen; expression a, b, c, d, e; constant C; type T; @@ ( - retlen = C; | T -retlen = C + retlen ; ) ... when != retlen when exists ( mtd_read(a, b, c, &retlen, d) | mtd_write(a, b, c, &retlen, d) | mtd_panic_write(a, b, c, &retlen, d) | mtd_point(a, b, c, &retlen, d, e) | mtd_read_fact_prot_reg(a, b, c, &retlen, d) | mtd_write_user_prot_reg(a, b, c, &retlen, d) | mtd_read_user_prot_reg(a, b, c, &retlen, d) | mtd_writev(a, b, c, d, &retlen) ) I ran it twice, because there were cases of double zero assigments in mtd tests. Then I went through the patch to verify that spatch did not find any false positives. Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09mtd: introduce mtd_block_isbad interfaceArtem Bityutskiy
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09mtd: introduce mtd_write_oob interfaceArtem Bityutskiy
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09mtd: introduce mtd_read_oob interfaceArtem Bityutskiy
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09mtd: introduce mtd_write interfaceArtem Bityutskiy
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09mtd: introduce mtd_read interfaceArtem Bityutskiy
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09mtd: introduce mtd_erase interfaceArtem Bityutskiy
This patch is part of a patch-set which changes the MTD interface from 'mtd->func()' form to 'mtd_func()' form. We need this because we want to add common code to to all drivers in the mtd core level, which is impossible with the current interface when MTD clients call driver functions like 'read()' or 'write()' directly. At this point we just introduce a new inline wrapper function, but later some of them are expected to gain more code. E.g., the input parameters check should be moved to the wrappers rather than be duplicated at many drivers. This particular patch introduced the 'mtd_erase()' interface. The following patches add all the other interfaces one by one. Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09mtd: tests: stresstest: bail out if device has not enough eraseblocksWolfram Sang
stresstest needs at least two eraseblocks. Bail out gracefully if that condition is not met. Fixes the following 'division by zero' OOPS: [ 619.100000] mtd_stresstest: MTD device size 131072, eraseblock size 131072, page size 2048, count of eraseblocks 1, pages per eraseblock 64, OOB size 64 [ 619.120000] mtd_stresstest: scanning for bad eraseblocks [ 619.120000] mtd_stresstest: scanned 1 eraseblocks, 0 are bad [ 619.130000] mtd_stresstest: doing operations [ 619.130000] mtd_stresstest: 0 operations done [ 619.140000] Division by zero in kernel. ... caused by /* Read or write up 2 eraseblocks at a time - hence 'ebcnt - 1' */ eb %= (ebcnt - 1); Cc: stable@kernel.org Signed-off-by: Wolfram Sang <w.sang@pengutronix.de> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2011-10-30mtd: tests: don't use mtd0 as a defaultWolfram Sang
mtd tests may erase the mtd device, so force the user to specify which mtd device to test by using the module parameter. Disable the default (using mtd0) since this may destroy a vital part of the flash if the module is inserted accidently or carelessly. Reported-by: Roland Kletzing <devzero@web.de> Signed-off-by: Wolfram Sang <w.sang@pengutronix.de> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@intel.com>
2011-09-21mtd: utilize `mtd_is_*()' functionsBrian Norris
Signed-off-by: Brian Norris <computersforpeace@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@intel.com>
2011-09-11mtd: rename MTD_OOB_* to MTD_OPS_*Brian Norris
These modes are not necessarily for OOB only. Particularly, MTD_OOB_RAW affected operations on in-band page data as well. To clarify these options and to emphasize that their effect is applied per-operation, we change the primary prefix to MTD_OPS_. Signed-off-by: Brian Norris <computersforpeace@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@intel.com>
2011-09-11mtd: tests: ignore corrected bitflips in OOB on mtd_readtestBrian Norris
read_oob may now return ECC error codes. If the code is -EUCLEAN, then we can safely ignore the error as a corrected bitflip. Signed-off-by: Brian Norris <computersforpeace@gmail.com> Signed-off-by: Artem Bityutskiy <dedekind1@gmail.com>
2011-03-11mtd: speedtest: fix integer overflowDavid Lambert
32-bit integers used in 'calc_speed()' may overflow and lead to incorrect results. Use 64-bit integers instead. Signed-off-by: David Lambert <dave@lambsys.com> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2011-03-11mtd: tests: add multiblock erase test to the mtd_speedtestRoman Tereshonkov
New multiblock erase speed test is added to mtd_speedtest. It consists of 2-, 4-, 8-, 16-, 32- and 64-blocks at once multiblock erase tests. Signed-off-by: Roman Tereshonkov <roman.tereshonkov@nokia.com> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2011-03-11mtd: tests: add count parameter to mtd_speedtestAdrian Hunter
By default mtd_speedtest uses all the eraseblocks of the MTD partition being tested. For large partitions a smaller number is sufficient and makes running the test quicker. For that reason, add a parameter 'count' to specify the maximum number of eraseblocks to use for testing. Signed-off-by: Adrian Hunter <adrian.hunter@nokia.com> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2011-03-11mtd: tests: print correct valuesRoman Tereshonkov
The ebcnt and pgcnt variable initialization is moved before printk which uses them. Signed-off-by: Roman Tereshonkov <roman.tereshonkov@nokia.com> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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