| Age | Commit message (Expand) | Author |
|---|---|---|
| 2016-07-27 | dm: Use dm_scan_fdt_dev() directly where possible | Simon Glass |
| 2015-05-21 | test: Generalize the unit test framework | Joe Hershberger |
| 2015-05-06 | dm: i2c: Add an explicit test mode to the sandbox I2C driver | Simon Glass |
| 2015-02-12 | dm: i2c: Add a dm_ prefix to driver model bus speed functions | Simon Glass |
| 2015-01-30 | dm: i2c: Provide an offset length parameter where needed | Simon Glass |
| 2015-01-30 | dm: i2c: Rename driver model I2C functions to permit compatibility | Simon Glass |
| 2014-12-11 | dm: i2c: Add tests for I2C | Simon Glass |
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index : u-boot | |
| NXP/Freescale LSDK U-boot tree with Scalys patches | www-data |
| summaryrefslogtreecommitdiff |