diff options
| -rw-r--r-- | doc/driver-model/README.txt | 229 |
1 files changed, 128 insertions, 101 deletions
diff --git a/doc/driver-model/README.txt b/doc/driver-model/README.txt index b891e84..7a24552 100644 --- a/doc/driver-model/README.txt +++ b/doc/driver-model/README.txt @@ -90,110 +90,137 @@ The intent with driver model is that the core portion has 100% test coverage in sandbox, and every uclass has its own test. As a move towards this, tests are provided in test/dm. To run them, try: - ./test/dm/test-dm.sh + ./test/py/test.py --bd sandbox --build -k ut_dm -v You should see something like this: - <...U-Boot banner...> - Running 53 driver model tests - Test: dm_test_autobind - Test: dm_test_autoprobe - Test: dm_test_bus_child_post_bind - Test: dm_test_bus_child_post_bind_uclass - Test: dm_test_bus_child_pre_probe_uclass - Test: dm_test_bus_children - Device 'c-test@0': seq 0 is in use by 'd-test' - Device 'c-test@1': seq 1 is in use by 'f-test' - Test: dm_test_bus_children_funcs - Test: dm_test_bus_children_iterators - Test: dm_test_bus_parent_data - Test: dm_test_bus_parent_data_uclass - Test: dm_test_bus_parent_ops - Test: dm_test_bus_parent_platdata - Test: dm_test_bus_parent_platdata_uclass - Test: dm_test_children - Test: dm_test_device_get_uclass_id - Test: dm_test_eth - Using eth@10002000 device - Using eth@10003000 device - Using eth@10004000 device - Test: dm_test_eth_alias - Using eth@10002000 device - Using eth@10004000 device - Using eth@10002000 device - Using eth@10003000 device - Test: dm_test_eth_prime - Using eth@10003000 device - Using eth@10002000 device - Test: dm_test_eth_rotate - - Error: eth@10004000 address not set. - - Error: eth@10004000 address not set. - Using eth@10002000 device - - Error: eth@10004000 address not set. - - Error: eth@10004000 address not set. - Using eth@10004000 device - Test: dm_test_fdt - Test: dm_test_fdt_offset - Test: dm_test_fdt_pre_reloc - Test: dm_test_fdt_uclass_seq - Test: dm_test_gpio - extra-gpios: get_value: error: gpio b5 not reserved - Test: dm_test_gpio_anon - Test: dm_test_gpio_copy - Test: dm_test_gpio_leak - extra-gpios: get_value: error: gpio b5 not reserved - Test: dm_test_gpio_phandles - Test: dm_test_gpio_requestf - Test: dm_test_i2c_bytewise - Test: dm_test_i2c_find - Test: dm_test_i2c_offset - Test: dm_test_i2c_offset_len - Test: dm_test_i2c_probe_empty - Test: dm_test_i2c_read_write - Test: dm_test_i2c_speed - Test: dm_test_leak - Test: dm_test_lifecycle - Test: dm_test_net_retry - Using eth@10004000 device - Using eth@10002000 device - Using eth@10004000 device - Test: dm_test_operations - Test: dm_test_ordering - Test: dm_test_pci_base - Test: dm_test_pci_swapcase - Test: dm_test_platdata - Test: dm_test_pre_reloc - Test: dm_test_remove - Test: dm_test_spi_find - Invalid chip select 0:0 (err=-19) - SF: Failed to get idcodes - SF: Detected M25P16 with page size 256 Bytes, erase size 64 KiB, total 2 MiB - Test: dm_test_spi_flash - 2097152 bytes written in 0 ms - SF: Detected M25P16 with page size 256 Bytes, erase size 64 KiB, total 2 MiB - SPI flash test: - 0 erase: 0 ticks, 65536000 KiB/s 524288.000 Mbps - 1 check: 0 ticks, 65536000 KiB/s 524288.000 Mbps - 2 write: 0 ticks, 65536000 KiB/s 524288.000 Mbps - 3 read: 0 ticks, 65536000 KiB/s 524288.000 Mbps - Test passed - 0 erase: 0 ticks, 65536000 KiB/s 524288.000 Mbps - 1 check: 0 ticks, 65536000 KiB/s 524288.000 Mbps - 2 write: 0 ticks, 65536000 KiB/s 524288.000 Mbps - 3 read: 0 ticks, 65536000 KiB/s 524288.000 Mbps - Test: dm_test_spi_xfer - SF: Detected M25P16 with page size 256 Bytes, erase size 64 KiB, total 2 MiB - Test: dm_test_uclass - Test: dm_test_uclass_before_ready - Test: dm_test_usb_base - Test: dm_test_usb_flash - USB-1: scanning bus 1 for devices... 2 USB Device(s) found - Failures: 0 - +(venv)$ ./test/py/test.py --bd sandbox --build -k ut_dm -v ++make O=/root/u-boot/build-sandbox -s sandbox_defconfig ++make O=/root/u-boot/build-sandbox -s -j8 +============================= test session starts ============================== +platform linux2 -- Python 2.7.5, pytest-2.9.0, py-1.4.31, pluggy-0.3.1 -- /root/u-boot/venv/bin/python +cachedir: .cache +rootdir: /root/u-boot, inifile: +collected 199 items + +test/py/tests/test_ut.py::test_ut_dm_init PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_adc_bind] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_adc_multi_channel_conversion] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_adc_multi_channel_shot] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_adc_single_channel_conversion] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_adc_single_channel_shot] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_adc_supply] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_adc_wrong_channel_selection] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_autobind] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_autobind_uclass_pdata_alloc] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_autobind_uclass_pdata_valid] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_autoprobe] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_bus_child_post_bind] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_bus_child_post_bind_uclass] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_bus_child_pre_probe_uclass] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_bus_children] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_bus_children_funcs] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_bus_children_iterators] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_bus_parent_data] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_bus_parent_data_uclass] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_bus_parent_ops] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_bus_parent_platdata] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_bus_parent_platdata_uclass] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_children] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_clk_base] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_clk_periph] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_device_get_uclass_id] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_eth] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_eth_act] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_eth_alias] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_eth_prime] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_eth_rotate] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_fdt] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_fdt_offset] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_fdt_pre_reloc] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_fdt_uclass_seq] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_gpio] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_gpio_anon] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_gpio_copy] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_gpio_leak] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_gpio_phandles] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_gpio_requestf] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_i2c_bytewise] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_i2c_find] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_i2c_offset] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_i2c_offset_len] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_i2c_probe_empty] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_i2c_read_write] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_i2c_speed] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_leak] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_led_base] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_led_gpio] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_led_label] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_lifecycle] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_mmc_base] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_net_retry] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_operations] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_ordering] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_pci_base] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_pci_busnum] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_pci_swapcase] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_platdata] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_power_pmic_get] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_power_pmic_io] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_autoset] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_autoset_list] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_get] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_set_get_current] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_set_get_enable] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_set_get_mode] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_set_get_voltage] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_pre_reloc] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_ram_base] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_regmap_base] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_regmap_syscon] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_remoteproc_base] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_remove] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_reset_base] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_reset_walk] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_rtc_base] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_rtc_dual] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_rtc_reset] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_rtc_set_get] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_spi_find] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_spi_flash] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_spi_xfer] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_syscon_base] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_syscon_by_driver_data] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_timer_base] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_uclass] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_uclass_before_ready] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_uclass_devices_find] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_uclass_devices_find_by_name] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_uclass_devices_get] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_uclass_devices_get_by_name] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_usb_base] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_usb_flash] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_usb_keyb] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_usb_multi] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_usb_remove] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_usb_tree] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_usb_tree_remove] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_usb_tree_reorder] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_video_base] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_video_bmp] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_video_bmp_comp] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_video_chars] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_video_context] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_video_rotation1] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_video_rotation2] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_video_rotation3] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_video_text] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_video_truetype] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_video_truetype_bs] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_video_truetype_scroll] PASSED + +======================= 84 tests deselected by '-kut_dm' ======================= +================== 115 passed, 84 deselected in 3.77 seconds =================== What is going on? ----------------- |